12:00 AM

OnBase by Hyland Experts Present Information Management Successes at Deltek INSIGHT

More than 3,000 project-focused professionals leveraging Deltek's portfolio of products will gather at Deltek Insight in Nashville on October 23-26. The annual conference provides attendees with the opportunity to share valuable best practices, learn the latest technology advancements and network with peers to solve business problems.

Among the educational sessions featured on the immersive agenda, the conference also includes two presentations about information management best practices and success stories utilizing a leading content services platform, OnBase by Hyland.

  • Learn how NCI Systems automates accounts payable with an enterprise information platform integrated with Deltek Costpoint. Aaron Sleezer, system engineer from NCI Systems, will discuss why an enterprise information platform is essential to its AP and accounts receivable processes leveraging the application for AP invoice automation, requisition submission and approval processing, and AR billing approvals.
  • Learn how to streamline transaction processing with an enterprise information platform integrated with Deltek Costpoint. Chris Zurn, team lead of professional services at Hyland, will share how enterprise information platforms help reduce manual processing, increase visibility into payment processes and provide secure and centralized document storage.

'We're excited to have a larger impact at the conference this year as a Gold Sponsor with two sessions included in the immersive and informative agenda,' said Danielle Simer, solution marketing manager at Hyland. 'Attendees will leave with valuable insights and best practices to better manage content, processes and cases across their finance and accounting operations, delivering action-oriented information management strategies when they return to their organizations.'

To learn more about Hyland's integrations with Deltek products, visit booth #3 at Deltek INSIGHT 2017, or visit OnBase.com/Deltek.